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苏维波. 荧光材料冷热冲击检测系统研制及应用[J]. 应用技术学报,2023,23(2):108-114.. DOI: 10.3969/j.issn.2096-3424.2023.02.003
引用本文: 苏维波. 荧光材料冷热冲击检测系统研制及应用[J]. 应用技术学报,2023,23(2):108-114.. DOI: 10.3969/j.issn.2096-3424.2023.02.003
SU Weibo. Development and application of cold and heat shock detection system for fluorescent materials[J]. Journal of Technology, 2023, 23(2): 108-114. DOI: 10.3969/j.issn.2096-3424.2023.02.003
Citation: SU Weibo. Development and application of cold and heat shock detection system for fluorescent materials[J]. Journal of Technology, 2023, 23(2): 108-114. DOI: 10.3969/j.issn.2096-3424.2023.02.003

荧光材料冷热冲击检测系统研制及应用

Development and application of cold and heat shock detection system for fluorescent materials

  • 摘要: 荧光材料是发光二极管(LED)的重要组成部分,荧光粉的光学性能参数对白光LED的研究起着重要作用。温度的变化往往对荧光材料的光学性能影响很大。通过使用半导体制冷片及水冷系统、单片机、荧光激发装置及积分球光谱检测系统,结合比例、积分和微分(PID)控制算法,设计制造了加热制冷装置和光学检测系统一体化测试仪器,实现了对荧光材料冷热冲击性能的实时检测。经过在实验室和企业中的实际应用,该设备能够实现温控精准、瞬态大幅度升降温、智能安全、实时在线检测功能。该仪器的研发,有助于对荧光材料可靠性的深入研究。

     

    Abstract: Fluorescent materials are an important component of light-emitting diode (LED), and the optical property parameters of phosphors play an important role in the study of white LED. The change of temperature often has great influence on the optical properties of fluorescent materials. By using the semiconductor refrigeration and water cooling system, single chip microcomputer, fluorescence excitation device and integrating sphere spectrum detection system, and combined with proportional, integral and derivative (PID) control algorithm, the heating and refrigeration device and optical detection system integration of the test instrument was designed and established, which accomplished the realization of real-time detection of fluorescence material cold and hot impact performance. After the practical application in laboratories and enterprises, the equipment has accurate temperature control, instantaneously sharp rise and drop of temperature, intelligent safety, and real-time online detection function. The development of this instrument contributes to the intensive study of the reliability of fluorescent materials.

     

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